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Step 01 Wafer Fabrication

PECVD System

Trion Technology Orion III PECVD HIGH ● Top cladding protects waveguides, provides optical isolation, and defines final device geometry

Role in QLT Fabrication

PECVD deposits the SiO₂ top cladding layer at low temperature (< 350°C), which is essential because higher-temperature processes (thermal oxidation at 1000°C, LPCVD at 700–900°C) would destroy the TiN heaters, metal interconnects, and any temperature-sensitive layers already on the chip.

The SiO₂ top cladding serves multiple functions:

  • Optical isolation ● confines guided modes within the Si₃N₄ waveguide core
  • Mechanical protection ● prevents surface damage during subsequent handling and packaging
  • Environmental barrier ● protects waveguides from humidity and contamination
  • Heater insulation ● electrically isolates TiN heaters from Au contact pads
  • Stress control ● film stress must be controlled to prevent wafer bowing and waveguide birefringence

Why PECVD (Not Other SiO₂ Methods)

MethodTemperatureFilm Quality (n)Compatible with TiN?Film StressRate
PECVD (our method)250–350°CGood (1.46–1.48)YesControllable50–100 nm/min
Thermal oxide900–1100°CExcellent (1.46)No ● destroys TiNLowSlow
LPCVD (TEOS)700–900°CVery good (1.46)No ● destroys TiNLow10–30 nm/min
Sputtered SiO₂25–200°CFair (porous, 1.44–1.47)YesVariable5–20 nm/min
ALD SiO₂100–300°CGood (conformal)YesLow~0.1 nm/cycle (very slow)

Film Requirements

ParameterTargetToleranceMeasurement
MaterialSiO₂
Thickness1.5 μm± 0.1 μmEllipsometry / profilometry
Refractive index @ 1550 nm1.46± 0.02Spectroscopic ellipsometry
Film stress< 200 MPa compressive< 300 MPaWafer bow measurement
Uniformity (150 mm)< 3% center-to-edge< 5%Multi-point ellipsometry
Particulate density< 10 particles/cm² (> 0.5 μm)Factory specParticle counter
Hydrogen contentLow (minimize N-H absorption)FTIR
Optical loss contribution< 0.1 dB/cm @ 1550 nmWaveguide transmission

PECVD Chemistry

SiO₂ PECVD PROCESS:

Precursors: SiH₄ (silane) + N₂O (nitrous oxide)
Carrier/purge: N₂
Temperature: 300°C (substrate)
Pressure: 0.5–1.5 Torr
RF power: 13.56 MHz, 50–200 W (typical); or 300-460 kHz LF

Reaction: SiH₄ + 2N₂O → SiO₂ + 2N₂ + 2H₂

Deposition rate: 50–100 nm/min
Time for 1.5 μm: 15–30 minutes

STRESS CONTROL:
├── Higher RF power → more compressive stress
├── Higher pressure → more tensile stress
├── Dual-frequency (HF + LF) → independent stress tuning
├── Oxford RF switching capability allows precise stress control
└── Target: < 200 MPa compressive for flat wafer

HYDROGEN MANAGEMENT (for photonic applications):
├── N-H bonds absorb at ~1500 nm (interfere with telecom C-band)
├── Optimize N₂O/SiH₄ ratio to minimize hydrogen incorporation
├── Post-deposition anneal: 300°C under N₂ (2 hr) drives out H₂
└── Use N₂O-rich conditions (ratio > 10:1) for lowest H content

Technical Specifications

MethodTemperatureFilm Quality (n)Compatible with TiN?Film StressRate
PECVD (our method)250–350°CGood (1.46–1.48)YesControllable50–100 nm/min
Thermal oxide900–1100°CExcellent (1.46)No ● destroys TiNLowSlow
LPCVD (TEOS)700–900°CVery good (1.46)No ● destroys TiNLow10–30 nm/min
Sputtered SiO₂25–200°CFair (porous, 1.44–1.47)YesVariable5–20 nm/min
ALD SiO₂100–300°CGood (conformal)YesLow~0.1 nm/cycle (very slow)
ParameterTargetToleranceMeasurement
MaterialSiO₂
Thickness1.5 μm± 0.1 μmEllipsometry / profilometry
Refractive index @ 1550 nm1.46± 0.02Spectroscopic ellipsometry
Film stress< 200 MPa compressive< 300 MPaWafer bow measurement
Uniformity (150 mm)< 3% center-to-edge< 5%Multi-point ellipsometry
Particulate density< 10 particles/cm² (> 0.5 μm)Factory specParticle counter
Hydrogen contentLow (minimize N-H absorption)FTIR
Optical loss contribution< 0.1 dB/cm @ 1550 nmWaveguide transmission
ParameterSpecification
ManufacturerOxford Instruments Plasma Technology, Yatton, UK
ModelPlasmaPro 80 PECVD
Websiteplasma.oxinst.com
ChamberCompact footprint, open-load design
Electrode size240 mm diameter
Substrate capacityUp to 200 mm wafers; multi-wafer or small pieces
Temperature range20–400°C (standard); up to 1200°C (PlasmaPro 100 option)
RF switchingYes ● independent stress control between HF and LF
Gas lines4, 8, or 12 MFC-controlled gas lines
PumpingClose-coupled turbo pump for high pumping speed
ProcessesSiO₂, SiNₓ, SiOₓNᵧ, a-Si:H; in-situ plasma clean with endpoint
Data logging< 500 ms data logging for traceability
Endpoint detectionLaser interferometry + OES (optical emission spectrometry)
ControlX20 control system
ComplianceSEMI S2/S8 built-in
ConfigurationsPlasmaPro 80 (open-load), PlasmaPro 100 (load-locked), PlasmaPro 800 (large area)
ParameterSpecification
ManufacturerTrion Technology, Clearwater, FL
ModelOrion III PECVD (or Minilock-Orion III with loadlock)
Websitetriontech.com
Electrode200 mm or 300 mm aluminum, hard-anodized
RF source300 W, 300–460 kHz bottom-powered (standard)
Triode option600 W, 13.56 MHz top-powered for stress control
Temperature50–400°C resistive heater with IR thermocouple
Gas deliveryUp to 8 MFCs; surface-mount C-seal or orbital-welded VCR
Pressure controlButterfly valve, process-controller operated
Wafer sizes2"–300 mm (single wafer or batch: 4×3", 3×4", 7×2")
Safety gasesNon-pyrophoric option: < 20% silane in N₂ (much safer)
ControlPC-based touch screen; graphical block-diagram recipe editor
SafetySEMI S2-0310/S8-0308; CE compliant
LoadlockMinilock-Orion III variant for chamber isolation
ProcessesOxides, nitrides, oxynitrides, a-Si, SiC

Process Integration

QLT PROCESS FLOW ● PECVD System (Step B8):

PRE-REQUISITES:
├── SiN chip with all waveguide processing complete
├── TiN heaters deposited and patterned (Steps B6-B7)
├── Al₂O₃ passivation over heaters (if applicable)
└── Chip cleaned (solvent clean + O₂ plasma descum)

STEP 1: System Warm-Up
├── Heat substrate electrode to 300°C (15 min)
├── Run conditioning wafer (dummy Si) with SiO₂ recipe
│   └── Coats chamber walls uniformly; reduces particle shedding
└── Verify gas flows and pressure control

STEP 2: Load Substrate
├── Place chip on electrode (center position)
├── For Minilock-Orion III: load through loadlock
└── Wait for temperature stabilization (2 min)

STEP 3: Pre-Clean (Optional)
├── Ar/O₂ plasma clean: 50 W, 30 s
└── Removes surface contaminants for better adhesion

STEP 4: SiO₂ Deposition
├── Execute recipe: SiH₄ + N₂O + N₂ at 1 Torr, 100 W
├── Deposit 1.5 μm (~19 min at 80 nm/min)
├── Monitor in-situ (if laser endpoint available)
└── End deposition; purge chamber with N₂

STEP 5: Cool-Down & Unload
├── Reduce electrode temp to 100°C (or use loadlock for fast swap)
├── Vent with dry N₂
└── Remove chip

STEP 6: Chamber Clean
├── Run NF₃ or CF₄/O₂ plasma clean (every 10-50 runs)
├── Oxford systems: in-situ plasma clean with endpoint detection
└── Trion: manual CF₄/O₂ clean recipe

STEP 7: Film Qualification
├── Ellipsometry: n = 1.46 ± 0.02, thickness 1.5 ± 0.1 μm
├── Stress measurement: < 200 MPa compressive
├── FTIR: confirm low N-H content
└── Visual inspection: no haze, particles, or delamination

Vendor Options & Pricing

New System Pricing

ModelManufacturerSubstratePrice (2025–2026)Lead Time
Oxford PlasmaPro 80 PECVDOxford Instruments (UK)Up to 200 mm$150,000–$250,00010–16 weeks
Oxford PlasmaPro 100 PECVDOxford Instruments (UK)Up to 200 mm (load-locked)$200,000–$350,00012–18 weeks
Trion Orion III PECVDTrion Technology (FL)Up to 300 mm$80,000–$150,0008–12 weeks
Trion Minilock-Orion IIITrion Technology (FL)Up to 300 mm (loadlock)$100,000–$180,0008–14 weeks
SPTS/STS 310PCSPTS Technologies (UK)Up to 200 mm$100,000–$200,00010–14 weeks
Samco PD-220NLSamco (Japan)Up to 200 mm$100,000–$180,00010–14 weeks
PlasmaTherm Versaline PECVDPlasmaTherm (FL)Up to 200 mm$120,000–$200,00010–16 weeks

Refurbished Market

ModelConditionPriceLead TimeSource
Oxford Plasmalab 80+Refurbished$30,000–$60,0003–6 weeksClassOne Equipment, LabX
Oxford Plasmalab 100 PECVDRefurbished to factory spec$50,000–$90,0004–8 weeksClassOne (6-month warranty)
Oxford Plasmalab 100 PECVD (2008, SiO₂/SiN)Full refurb, load-locked, 600W RF, 7 gasesInquire (~$70k–$90k est.)4–6 weeksClassOne via LabX
Plasma-Therm 790 / SLR 770As-is$20,000–$40,0002–4 weeksFabSurplus, CAE
Plasma-Therm VLR 700 PECVDAs-is$15,000–$35,0001–3 weeksFabSurplus
Plasma-Therm LAPECVD (2015)As-is (4 units available)$25,000–$50,000ImmediateFabSurplus
SPTS/STS 310Tested$25,000–$55,0003–6 weeksUsed-Line, LabX

Vendor Directory

VendorTypeContactNotes
Oxford InstrumentsOEM (new)plasma.oxinst.comUK-based; gold standard for photonics PECVD
Trion TechnologyOEM (new)triontech.com / Clearwater, FLBudget-friendly; dilute SiH₄ option
PlasmaThermOEM (new)plasmatherm.com / St. Petersburg, FLVersaline platform; US-made
SPTS TechnologiesOEM (new)spts.com / Newport, UKPart of KLA group
Samco Inc.OEM (new)samcointl.com / JapanStrong Asian presence
ClassOne EquipmentRefurbished specialistclassoneequipment.comOxford/PlasmaTherm specialist; 6-12 month warranty
LabXUsed marketplacelabx.comOxford Plasmalab listings
FabSurplus (SDI)Used semiconductorfabsurplus.comPlasmaTherm inventory
SemiStarUsed dealersemistarcorp.comOxford Plasmalab 100 listings
Nano VacuumDistributornanovactech.comOxford distributor (ANZ)

Facility Requirements

CRITICAL SAFETY ● SiH₄ (Silane) Handling

⚠️  SILANE (SiH₄) IS PYROPHORIC ● SPONTANEOUSLY IGNITES IN AIR  ⚠️

This is the MOST DANGEROUS gas in our entire fabrication process.

SiH₄ safety infrastructure is MANDATORY before PECVD can be installed:

├── Gas cabinet (pyrophoric/toxic rated): $3,000–$8,000
│   └── Coaxial tubing; sprinkler head; exhaust; flow-limiting orifice
├── Toxic/combustible gas monitor (SiH₄ sensor): $2,000–$5,000
│   └── TLV-TWA = 5 ppm; alarm at 1 ppm; auto-shutoff at 2 ppm
├── Auto-shutoff valve (pneumatic + solenoid): $1,000–$2,000
│   └── Interlocked to gas monitor and fire alarm
├── Fire suppression (gas cabinet integral): Included
├── Emergency shut-off panel: $500–$1,000
└── Exhaust ventilation: continuous when cylinder connected

SAFETY INFRASTRUCTURE TOTAL: $6,500–$16,000

ALTERNATIVE: Use Trion Orion III with <20% SiH₄ premix in N₂:
├── Premixed silane is NOT pyrophoric below 4.3% (LEL)
├── <20% premix still requires gas cabinet but simpler/cheaper
├── Significantly reduces fire/explosion risk
└── Recommended for startup labs without dedicated safety engineer

Space and Utilities

ParameterSpecification
Power3-phase, 208V, 30A (total system: 8–12 kW)
RF generator13.56 MHz, 300–600 W (included with system)
LF generator300–460 kHz, 300 W (Trion standard; Oxford option)
SiH₄ gasPyrophoric ● gas cabinet + monitors MANDATORY
SiH₄ cost$300–$500/cylinder; ~1 cylinder per 50 depositions
N₂O gasNon-toxic; standard gas rack; ~$200/cylinder
N₂ carrierHouse N₂ or LN₂ dewar
NH₃ gasIf depositing SiNₓ (not needed for SiO₂ only)
ExhaustDry pump exhaust → scrubber (#34) ● MANDATORY
Cooling waterRecirculating chiller, 3 kW thermal
Floor space1.5 m × 1.5 m (similar to ICP-RIE #01)
Weight200–400 kg (system dependent)
VibrationNot sensitive
TemperatureStandard lab 18–25°C

Gas and Safety Infrastructure Itemized

Safety ItemCostRequired For
Gas cabinet (pyrophoric/toxic rated)$3,000–$8,000SiH₄ cylinder
Toxic/combustible gas monitor (SiH₄)$2,000–$5,000Area monitoring
Auto-shutoff valve (pneumatic + solenoid)$1,000–$2,000Automated response
Emergency shut-off panel$500–$1,000Manual override
Gas cabinet exhaust duct$500–$1,000Continuous ventilation
Fire suppression (integral)IncludedCabinet standard
N₂O regulator + panel$300–$500Gas delivery
Gas line installation (VCR fittings)$1,000–$3,000Plumbing
TOTAL SAFETY INFRASTRUCTURE$8,500–$20,500

Safety & Handling

Hazard Summary

HazardSourceRisk LevelControls
SiH₄ leak → fire/explosionPyrophoric gasCRITICALGas cabinet + monitors + auto-shutoff + fire suppression
SiH₄ inhalationToxic gas (TLV-TWA 5 ppm)HIGHContinuous monitoring; ventilation; auto-shutoff
RF radiation13.56 MHz generatorLOWShielded enclosure; interlock on chamber door
Hot surfaces300–400°C electrodeMEDIUMCool-down SOP; warning labels
Chamber particlesSiO₂ flake buildupLOWRegular plasma clean; conditioning wafer

Emergency Procedures

SiH₄ LEAK RESPONSE:

1. EVACUATE the area immediately (do NOT attempt to close valves)
2. Pull emergency shut-off if accessible WITHOUT entering gas plume
3. Call emergency services (facility fire department)
4. Auto-shutoff should engage if gas monitor detects > 2 ppm
5. SiH₄ burns with INVISIBLE FLAME ● assume fire if you hear hissing
6. Do NOT use water on SiH₄ fire (forms SiO₂ dust; water can cause
hydrogen explosion in confined space)
7. Allow gas to burn out; ventilate area thoroughly before re-entry
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