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PECVD System
Trion Technology Orion III PECVD HIGH ● Top cladding protects waveguides, provides optical isolation, and defines final device geometryRole in QLT Fabrication
PECVD deposits the SiO₂ top cladding layer at low temperature (< 350°C), which is essential because higher-temperature processes (thermal oxidation at 1000°C, LPCVD at 700–900°C) would destroy the TiN heaters, metal interconnects, and any temperature-sensitive layers already on the chip.
The SiO₂ top cladding serves multiple functions:
- Optical isolation ● confines guided modes within the Si₃N₄ waveguide core
- Mechanical protection ● prevents surface damage during subsequent handling and packaging
- Environmental barrier ● protects waveguides from humidity and contamination
- Heater insulation ● electrically isolates TiN heaters from Au contact pads
- Stress control ● film stress must be controlled to prevent wafer bowing and waveguide birefringence
Why PECVD (Not Other SiO₂ Methods)
| Method | Temperature | Film Quality (n) | Compatible with TiN? | Film Stress | Rate |
|---|---|---|---|---|---|
| PECVD (our method) | 250–350°C | Good (1.46–1.48) | Yes | Controllable | 50–100 nm/min |
| Thermal oxide | 900–1100°C | Excellent (1.46) | No ● destroys TiN | Low | Slow |
| LPCVD (TEOS) | 700–900°C | Very good (1.46) | No ● destroys TiN | Low | 10–30 nm/min |
| Sputtered SiO₂ | 25–200°C | Fair (porous, 1.44–1.47) | Yes | Variable | 5–20 nm/min |
| ALD SiO₂ | 100–300°C | Good (conformal) | Yes | Low | ~0.1 nm/cycle (very slow) |
Film Requirements
| Parameter | Target | Tolerance | Measurement |
|---|---|---|---|
| Material | SiO₂ | ● | ● |
| Thickness | 1.5 μm | ± 0.1 μm | Ellipsometry / profilometry |
| Refractive index @ 1550 nm | 1.46 | ± 0.02 | Spectroscopic ellipsometry |
| Film stress | < 200 MPa compressive | < 300 MPa | Wafer bow measurement |
| Uniformity (150 mm) | < 3% center-to-edge | < 5% | Multi-point ellipsometry |
| Particulate density | < 10 particles/cm² (> 0.5 μm) | Factory spec | Particle counter |
| Hydrogen content | Low (minimize N-H absorption) | ● | FTIR |
| Optical loss contribution | < 0.1 dB/cm @ 1550 nm | ● | Waveguide transmission |
PECVD Chemistry
SiO₂ PECVD PROCESS: Precursors: SiH₄ (silane) + N₂O (nitrous oxide) Carrier/purge: N₂ Temperature: 300°C (substrate) Pressure: 0.5–1.5 Torr RF power: 13.56 MHz, 50–200 W (typical); or 300-460 kHz LF Reaction: SiH₄ + 2N₂O → SiO₂ + 2N₂ + 2H₂ Deposition rate: 50–100 nm/min Time for 1.5 μm: 15–30 minutes STRESS CONTROL: ├── Higher RF power → more compressive stress ├── Higher pressure → more tensile stress ├── Dual-frequency (HF + LF) → independent stress tuning ├── Oxford RF switching capability allows precise stress control └── Target: < 200 MPa compressive for flat wafer HYDROGEN MANAGEMENT (for photonic applications): ├── N-H bonds absorb at ~1500 nm (interfere with telecom C-band) ├── Optimize N₂O/SiH₄ ratio to minimize hydrogen incorporation ├── Post-deposition anneal: 300°C under N₂ (2 hr) drives out H₂ └── Use N₂O-rich conditions (ratio > 10:1) for lowest H content
Technical Specifications
| Method | Temperature | Film Quality (n) | Compatible with TiN? | Film Stress | Rate |
|---|---|---|---|---|---|
| PECVD (our method) | 250–350°C | Good (1.46–1.48) | Yes | Controllable | 50–100 nm/min |
| Thermal oxide | 900–1100°C | Excellent (1.46) | No ● destroys TiN | Low | Slow |
| LPCVD (TEOS) | 700–900°C | Very good (1.46) | No ● destroys TiN | Low | 10–30 nm/min |
| Sputtered SiO₂ | 25–200°C | Fair (porous, 1.44–1.47) | Yes | Variable | 5–20 nm/min |
| ALD SiO₂ | 100–300°C | Good (conformal) | Yes | Low | ~0.1 nm/cycle (very slow) |
| Parameter | Target | Tolerance | Measurement |
|---|---|---|---|
| Material | SiO₂ | ● | ● |
| Thickness | 1.5 μm | ± 0.1 μm | Ellipsometry / profilometry |
| Refractive index @ 1550 nm | 1.46 | ± 0.02 | Spectroscopic ellipsometry |
| Film stress | < 200 MPa compressive | < 300 MPa | Wafer bow measurement |
| Uniformity (150 mm) | < 3% center-to-edge | < 5% | Multi-point ellipsometry |
| Particulate density | < 10 particles/cm² (> 0.5 μm) | Factory spec | Particle counter |
| Hydrogen content | Low (minimize N-H absorption) | ● | FTIR |
| Optical loss contribution | < 0.1 dB/cm @ 1550 nm | ● | Waveguide transmission |
| Parameter | Specification |
|---|---|
| Manufacturer | Oxford Instruments Plasma Technology, Yatton, UK |
| Model | PlasmaPro 80 PECVD |
| Website | plasma.oxinst.com |
| Chamber | Compact footprint, open-load design |
| Electrode size | 240 mm diameter |
| Substrate capacity | Up to 200 mm wafers; multi-wafer or small pieces |
| Temperature range | 20–400°C (standard); up to 1200°C (PlasmaPro 100 option) |
| RF switching | Yes ● independent stress control between HF and LF |
| Gas lines | 4, 8, or 12 MFC-controlled gas lines |
| Pumping | Close-coupled turbo pump for high pumping speed |
| Processes | SiO₂, SiNₓ, SiOₓNᵧ, a-Si:H; in-situ plasma clean with endpoint |
| Data logging | < 500 ms data logging for traceability |
| Endpoint detection | Laser interferometry + OES (optical emission spectrometry) |
| Control | X20 control system |
| Compliance | SEMI S2/S8 built-in |
| Configurations | PlasmaPro 80 (open-load), PlasmaPro 100 (load-locked), PlasmaPro 800 (large area) |
| Parameter | Specification |
|---|---|
| Manufacturer | Trion Technology, Clearwater, FL |
| Model | Orion III PECVD (or Minilock-Orion III with loadlock) |
| Website | triontech.com |
| Electrode | 200 mm or 300 mm aluminum, hard-anodized |
| RF source | 300 W, 300–460 kHz bottom-powered (standard) |
| Triode option | 600 W, 13.56 MHz top-powered for stress control |
| Temperature | 50–400°C resistive heater with IR thermocouple |
| Gas delivery | Up to 8 MFCs; surface-mount C-seal or orbital-welded VCR |
| Pressure control | Butterfly valve, process-controller operated |
| Wafer sizes | 2"–300 mm (single wafer or batch: 4×3", 3×4", 7×2") |
| Safety gases | Non-pyrophoric option: < 20% silane in N₂ (much safer) |
| Control | PC-based touch screen; graphical block-diagram recipe editor |
| Safety | SEMI S2-0310/S8-0308; CE compliant |
| Loadlock | Minilock-Orion III variant for chamber isolation |
| Processes | Oxides, nitrides, oxynitrides, a-Si, SiC |
Process Integration
QLT PROCESS FLOW ● PECVD System (Step B8): PRE-REQUISITES: ├── SiN chip with all waveguide processing complete ├── TiN heaters deposited and patterned (Steps B6-B7) ├── Al₂O₃ passivation over heaters (if applicable) └── Chip cleaned (solvent clean + O₂ plasma descum) STEP 1: System Warm-Up ├── Heat substrate electrode to 300°C (15 min) ├── Run conditioning wafer (dummy Si) with SiO₂ recipe │ └── Coats chamber walls uniformly; reduces particle shedding └── Verify gas flows and pressure control STEP 2: Load Substrate ├── Place chip on electrode (center position) ├── For Minilock-Orion III: load through loadlock └── Wait for temperature stabilization (2 min) STEP 3: Pre-Clean (Optional) ├── Ar/O₂ plasma clean: 50 W, 30 s └── Removes surface contaminants for better adhesion STEP 4: SiO₂ Deposition ├── Execute recipe: SiH₄ + N₂O + N₂ at 1 Torr, 100 W ├── Deposit 1.5 μm (~19 min at 80 nm/min) ├── Monitor in-situ (if laser endpoint available) └── End deposition; purge chamber with N₂ STEP 5: Cool-Down & Unload ├── Reduce electrode temp to 100°C (or use loadlock for fast swap) ├── Vent with dry N₂ └── Remove chip STEP 6: Chamber Clean ├── Run NF₃ or CF₄/O₂ plasma clean (every 10-50 runs) ├── Oxford systems: in-situ plasma clean with endpoint detection └── Trion: manual CF₄/O₂ clean recipe STEP 7: Film Qualification ├── Ellipsometry: n = 1.46 ± 0.02, thickness 1.5 ± 0.1 μm ├── Stress measurement: < 200 MPa compressive ├── FTIR: confirm low N-H content └── Visual inspection: no haze, particles, or delamination
Vendor Options & Pricing
New System Pricing
| Model | Manufacturer | Substrate | Price (2025–2026) | Lead Time |
|---|---|---|---|---|
| Oxford PlasmaPro 80 PECVD | Oxford Instruments (UK) | Up to 200 mm | $150,000–$250,000 | 10–16 weeks |
| Oxford PlasmaPro 100 PECVD | Oxford Instruments (UK) | Up to 200 mm (load-locked) | $200,000–$350,000 | 12–18 weeks |
| Trion Orion III PECVD | Trion Technology (FL) | Up to 300 mm | $80,000–$150,000 | 8–12 weeks |
| Trion Minilock-Orion III | Trion Technology (FL) | Up to 300 mm (loadlock) | $100,000–$180,000 | 8–14 weeks |
| SPTS/STS 310PC | SPTS Technologies (UK) | Up to 200 mm | $100,000–$200,000 | 10–14 weeks |
| Samco PD-220NL | Samco (Japan) | Up to 200 mm | $100,000–$180,000 | 10–14 weeks |
| PlasmaTherm Versaline PECVD | PlasmaTherm (FL) | Up to 200 mm | $120,000–$200,000 | 10–16 weeks |
Refurbished Market
| Model | Condition | Price | Lead Time | Source |
|---|---|---|---|---|
| Oxford Plasmalab 80+ | Refurbished | $30,000–$60,000 | 3–6 weeks | ClassOne Equipment, LabX |
| Oxford Plasmalab 100 PECVD | Refurbished to factory spec | $50,000–$90,000 | 4–8 weeks | ClassOne (6-month warranty) |
| Oxford Plasmalab 100 PECVD (2008, SiO₂/SiN) | Full refurb, load-locked, 600W RF, 7 gases | Inquire (~$70k–$90k est.) | 4–6 weeks | ClassOne via LabX |
| Plasma-Therm 790 / SLR 770 | As-is | $20,000–$40,000 | 2–4 weeks | FabSurplus, CAE |
| Plasma-Therm VLR 700 PECVD | As-is | $15,000–$35,000 | 1–3 weeks | FabSurplus |
| Plasma-Therm LAPECVD (2015) | As-is (4 units available) | $25,000–$50,000 | Immediate | FabSurplus |
| SPTS/STS 310 | Tested | $25,000–$55,000 | 3–6 weeks | Used-Line, LabX |
Vendor Directory
| Vendor | Type | Contact | Notes |
|---|---|---|---|
| Oxford Instruments | OEM (new) | plasma.oxinst.com | UK-based; gold standard for photonics PECVD |
| Trion Technology | OEM (new) | triontech.com / Clearwater, FL | Budget-friendly; dilute SiH₄ option |
| PlasmaTherm | OEM (new) | plasmatherm.com / St. Petersburg, FL | Versaline platform; US-made |
| SPTS Technologies | OEM (new) | spts.com / Newport, UK | Part of KLA group |
| Samco Inc. | OEM (new) | samcointl.com / Japan | Strong Asian presence |
| ClassOne Equipment | Refurbished specialist | classoneequipment.com | Oxford/PlasmaTherm specialist; 6-12 month warranty |
| LabX | Used marketplace | labx.com | Oxford Plasmalab listings |
| FabSurplus (SDI) | Used semiconductor | fabsurplus.com | PlasmaTherm inventory |
| SemiStar | Used dealer | semistarcorp.com | Oxford Plasmalab 100 listings |
| Nano Vacuum | Distributor | nanovactech.com | Oxford distributor (ANZ) |
Facility Requirements
CRITICAL SAFETY ● SiH₄ (Silane) Handling
⚠️ SILANE (SiH₄) IS PYROPHORIC ● SPONTANEOUSLY IGNITES IN AIR ⚠️ This is the MOST DANGEROUS gas in our entire fabrication process. SiH₄ safety infrastructure is MANDATORY before PECVD can be installed: ├── Gas cabinet (pyrophoric/toxic rated): $3,000–$8,000 │ └── Coaxial tubing; sprinkler head; exhaust; flow-limiting orifice ├── Toxic/combustible gas monitor (SiH₄ sensor): $2,000–$5,000 │ └── TLV-TWA = 5 ppm; alarm at 1 ppm; auto-shutoff at 2 ppm ├── Auto-shutoff valve (pneumatic + solenoid): $1,000–$2,000 │ └── Interlocked to gas monitor and fire alarm ├── Fire suppression (gas cabinet integral): Included ├── Emergency shut-off panel: $500–$1,000 └── Exhaust ventilation: continuous when cylinder connected SAFETY INFRASTRUCTURE TOTAL: $6,500–$16,000 ALTERNATIVE: Use Trion Orion III with <20% SiH₄ premix in N₂: ├── Premixed silane is NOT pyrophoric below 4.3% (LEL) ├── <20% premix still requires gas cabinet but simpler/cheaper ├── Significantly reduces fire/explosion risk └── Recommended for startup labs without dedicated safety engineer
Space and Utilities
| Parameter | Specification |
|---|---|
| Power | 3-phase, 208V, 30A (total system: 8–12 kW) |
| RF generator | 13.56 MHz, 300–600 W (included with system) |
| LF generator | 300–460 kHz, 300 W (Trion standard; Oxford option) |
| SiH₄ gas | Pyrophoric ● gas cabinet + monitors MANDATORY |
| SiH₄ cost | $300–$500/cylinder; ~1 cylinder per 50 depositions |
| N₂O gas | Non-toxic; standard gas rack; ~$200/cylinder |
| N₂ carrier | House N₂ or LN₂ dewar |
| NH₃ gas | If depositing SiNₓ (not needed for SiO₂ only) |
| Exhaust | Dry pump exhaust → scrubber (#34) ● MANDATORY |
| Cooling water | Recirculating chiller, 3 kW thermal |
| Floor space | 1.5 m × 1.5 m (similar to ICP-RIE #01) |
| Weight | 200–400 kg (system dependent) |
| Vibration | Not sensitive |
| Temperature | Standard lab 18–25°C |
Gas and Safety Infrastructure Itemized
| Safety Item | Cost | Required For |
|---|---|---|
| Gas cabinet (pyrophoric/toxic rated) | $3,000–$8,000 | SiH₄ cylinder |
| Toxic/combustible gas monitor (SiH₄) | $2,000–$5,000 | Area monitoring |
| Auto-shutoff valve (pneumatic + solenoid) | $1,000–$2,000 | Automated response |
| Emergency shut-off panel | $500–$1,000 | Manual override |
| Gas cabinet exhaust duct | $500–$1,000 | Continuous ventilation |
| Fire suppression (integral) | Included | Cabinet standard |
| N₂O regulator + panel | $300–$500 | Gas delivery |
| Gas line installation (VCR fittings) | $1,000–$3,000 | Plumbing |
| TOTAL SAFETY INFRASTRUCTURE | $8,500–$20,500 |
Safety & Handling
Hazard Summary
| Hazard | Source | Risk Level | Controls |
|---|---|---|---|
| SiH₄ leak → fire/explosion | Pyrophoric gas | CRITICAL | Gas cabinet + monitors + auto-shutoff + fire suppression |
| SiH₄ inhalation | Toxic gas (TLV-TWA 5 ppm) | HIGH | Continuous monitoring; ventilation; auto-shutoff |
| RF radiation | 13.56 MHz generator | LOW | Shielded enclosure; interlock on chamber door |
| Hot surfaces | 300–400°C electrode | MEDIUM | Cool-down SOP; warning labels |
| Chamber particles | SiO₂ flake buildup | LOW | Regular plasma clean; conditioning wafer |
Emergency Procedures
SiH₄ LEAK RESPONSE: 1. EVACUATE the area immediately (do NOT attempt to close valves) 2. Pull emergency shut-off if accessible WITHOUT entering gas plume 3. Call emergency services (facility fire department) 4. Auto-shutoff should engage if gas monitor detects > 2 ppm 5. SiH₄ burns with INVISIBLE FLAME ● assume fire if you hear hissing 6. Do NOT use water on SiH₄ fire (forms SiO₂ dust; water can cause hydrogen explosion in confined space) 7. Allow gas to burn out; ventilate area thoroughly before re-entry