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Step 03 Etch & Strip

ICP-RIE

Oxford Instruments Plasma Technology (OIPT), Yatton, Bristol, UK

$75,000 (refurb) or $200,000 (new Trion) CRITICAL ● Single most important fabrication tool in post-MPW processing

Role in QLT Fabrication

The ICP-RIE is the workhorse etch tool for all post-MPW pattern transfer. It performs three distinct etch jobs:

JobChemistryTargetEtch DepthSelectivity Req.
B2: SiO₂ cladding windowCHF₃ (25 sccm) / O₂ (5 sccm) / Ar (10 sccm)Open 3.3 μm SiO₂ to expose SiN3.3 μm ± 0.1 μm>10:1 SiO₂:SiN (endpoint on SiN)
G4: As₂S₃ patterningCF₄ (20 sccm) / O₂ (5 sccm)Pattern 500 nm As₂S₃ overlay500 nm ± 20 nm>5:1 As₂S₃:SiO₂ (stop on ALD spacer)
Chamber cleanO₃ plasma or CF₄/O₂Remove polymer depositsN/AN/A

Why ICP specifically (not parallel-plate RIE): The ICP source decouples ion density from ion energy, allowing high etch rates with low damage ● critical for preserving the sub-1 nm RMS surface roughness of the SiN waveguide core underneath the SiO₂ cladding.

Process Criticality

The ICP-RIE directly determines:

  • Waveguide surface quality ● ion bombardment energy must remain below the SiN damage threshold (~200 eV) to preserve optical loss < 1 dB/cm
  • Etch profile verticality ● sidewall angles > 85° required for pattern fidelity in As₂S₃ overlay structures
  • Endpoint precision ● stopping within ±0.1 μm of the SiN surface in the SiO₂ cladding etch prevents waveguide damage or incomplete window opening
  • Cross-contamination control ● arsenic residues from As₂S₃ etch must not contaminate subsequent oxide etch recipes

Recommended Configuration

The PlasmaPro 100 Cobra is the gold standard for R&D and small-volume ICP-RIE processing. It has the largest install base in university and startup photonics labs worldwide.

ParameterSpecification
ManufacturerOxford Instruments Plasma Technology (OIPT), Yatton, UK
ModelPlasmaPro 100 Cobra (ICP-RIE configuration)
Legacy namePlasmalab System 100 ICP380
ConfigurationSingle chamber, ICP source + independent RIE bias
Wafer capacityUp to 200 mm (8"); 100 mm standard for our application
ICP sourceCobra® high-density ICP; available in 65 mm, 180 mm, and 300 mm source sizes
ICP source power0–3000 W at 13.56 MHz (typical: 300–1500 W for our recipes)
RIE bias power0–600 W at 13.56 MHz (typical: 50–200 W for our recipes)
Pressure range1–100 mTorr (APC butterfly valve)
Temperature-150°C to +400°C electrode (LN₂ or He backside cooling, chiller, or resistive heating)
Gas linesUp to 8 MFC channels (standard: 4–6); dual gas pod option
Load-lockOptional single-wafer load-lock or cluster (up to 5 modules)
Endpoint detectionOptical emission spectroscopy (OES) ● standard; Ocean Optics variable wavelength
ControlPC-based; new PTIQ intelligent software for optimized process control
Wafer clampingHe backside cooling; quartz clamp with continuous contact
Key featureVariable height electrode accommodates substrates up to 10 mm thick

New for 2025–2026: Oxford Instruments has released the PTIQ software platform, offering an intuitive new UI, system health monitoring, and advanced process optimization. Systems ordered in 2026 include PTIQ as standard.

ParameterSpecification
ManufacturerOxford Instruments Plasma Technology (OIPT), Yatton, UK
ModelPlasmaPro 100 Cobra (ICP-RIE configuration)
Legacy namePlasmalab System 100 ICP380
ConfigurationSingle chamber, ICP source + independent RIE bias
Wafer capacityUp to 200 mm (8"); 100 mm standard for our application
ICP sourceCobra® high-density ICP; available in 65 mm, 180 mm, and 300 mm source sizes
ICP source power0–3000 W at 13.56 MHz (typical: 300–1500 W for our recipes)
RIE bias power0–600 W at 13.56 MHz (typical: 50–200 W for our recipes)
Pressure range1–100 mTorr (APC butterfly valve)
Temperature-150°C to +400°C electrode (LN₂ or He backside cooling, chiller, or resistive heating)
Gas linesUp to 8 MFC channels (standard: 4–6); dual gas pod option
Load-lockOptional single-wafer load-lock or cluster (up to 5 modules)
Endpoint detectionOptical emission spectroscopy (OES) ● standard; Ocean Optics variable wavelength
ControlPC-based; new PTIQ intelligent software for optimized process control
Wafer clampingHe backside cooling; quartz clamp with continuous contact
Key featureVariable height electrode accommodates substrates up to 10 mm thick
AlternativeProsConsApprox. Used Price
Oxford PlasmaPro 80 (Plasmalab 80+)Simpler, cheaper, same vendorNo independent ICP source ● RIE only; less process control$40–60k used
SPTS (KLA) APS/PegasusExcellent ICP uniformity; production-gradeExpensive even used; 200 mm oriented; complex maintenance$80–150k used
Plasma-Therm Pinnacle/VersalineGood process flexibilityLess common in used market; fewer service technicians available$60–100k used
Trion Minilock Phantom III ICPCompact; load-locked; good for 100 mmLower power ICP (600–1250 W); limited process gas capacity$30–50k used
Samco RIE-101iPHCompact desktop; low costLimited power; no true ICP separation; small wafer only$20–30k used
GasPurityMFC RangePrimary UseSafety Classification
CHF₃99.99%0–50 sccmSiO₂ etch (B2)Toxic; gas cabinet required
CF₄99.99%0–50 sccmAs₂S₃ etch (G4); chamber cleanLow toxicity; irritant
O₂99.999%0–50 sccmAdditive for selectivity + polymer control; chamber cleanOxidizer
Ar99.999%0–50 sccmPhysical sputter component; carrier gasInert
N₂99.999%House supplyLoad-lock purge; system purgeInert
He99.999%0–20 sccmBackside wafer cooling (if cryo-chuck)Inert

Process Integration

B2: SiO₂ Cladding Window Etch

  • Load photoresist-patterned wafer via load-lock (SPR-220 mask, post-develop hard-bake)
  • Pump down to base pressure (<5 × 10⁻⁶ Torr)
  • Strike plasma: CHF₃ 25 / O₂ 5 / Ar 10 sccm; ICP 1000 W; RIE 100 W; 10 mTorr
  • Monitor OES for SiN endpoint (F radical intensity decrease when SiO₂ cleared)
  • Etch time: ~33 min for 3.3 μm SiO₂ at 100 nm/min
  • Stop etch; pump down; unload via load-lock
  • Inspect under microscope: verify complete window opening; check resist integrity
  • Proceed to resist strip (wet bench #06)

G4: As₂S₃ Patterning Etch

  • Load As₂S₃-coated wafer with patterned resist mask
  • Strike plasma: CF₄ 20 / O₂ 5 sccm; ICP 600 W; RIE 50 W; 5 mTorr
  • Etch time: ~6 min for 500 nm As₂S₃ at 80 nm/min
  • Monitor OES for endpoint (As/S emission lines decrease at SiO₂ interface)
  • Over-etch 10% (~36 s) to ensure pattern completion
  • Unload; inspect As₂S₃ pattern fidelity

Chamber Clean (Between Process Changes)

  • Run O₂/CF₄ clean recipe: 40/20 sccm; ICP 800 W; 0 W bias; 50 mTorr; 5 min
  • Run 3× if switching from As₂S₃ to SiO₂ etch (arsenic cross-contamination prevention)
  • Run conditioning wafer (dummy Si) after clean before production wafer

Vendor Options & Pricing

New System Cost

ConfigurationApproximate New Price (2025–2026)
Oxford PlasmaPro 100 Cobra (basic, 4 gas, 100 mm, 65 mm source)$350,000–$450,000
Oxford PlasmaPro 100 Cobra (full, 8 gas, 200 mm, 300 mm source, cryo, PTIQ)$500,000–$700,000
Oxford PlasmaPro 100 Cobra clustered (2+ modules)$700,000–$1,200,000
SPTS Pegasus (production ICP-DRIE)$600,000–$1,200,000
Trion Minilock Phantom III ICP (new)$180,000–$250,000

Note: New prices are not published. Estimates from university NSF MRI grant budgets, published equipment proposals, and industry sources. Actual pricing requires direct quote from Oxford Instruments.

Used/Refurbished Market

ConditionPrice RangeWhat You Get
"As-Is" from liquidation$15,000–$40,000No testing; may need $10–30k in repairs; no warranty; buyer handles shipping
Tested / cosmetic refurb$40,000–$80,000Pumped down; basic function verified; cleaned; 30-day warranty typical
Full OEM-spec refurb$80,000–$150,000All seals replaced; MFCs calibrated; RF generators tested; new PC; 6–12 month warranty
"Like New" late-vintage$120,000–$200,000Recent-build used tool; full documentation; near-new performance

Where to Buy

DealerWebsiteContactSpecialization
Capovani Brothers Inc.capovani.com[email protected] / (518) 346-8347Major used semi-equipment; strong Oxford/SPTS stock
ClassOne Equipmentclassoneequipment.comSales via websiteSpecialized Oxford, Plasma-Therm refurbishment; turnkey install + training
CAE Onlinecaeonline.comVia websiteGlobal aggregator; broad inventory
SemiStar Corpsemistarcorp.comVia websiteRefurbs including STS/SPTS and Oxford systems
CapEx Outsourcecapexoutsource.comVia websiteGlobal; strong STS/Plasma-Therm inventory
Machiniomachinio.comSearch + RFQAggregator marketplace
FabSurplusfabsurplus.comVia websitePre-owned semiconductor tools

Cost History & Market Dynamics

USED ICP-RIE PRICE TREND (Oxford Plasmalab 100):

2018-2019:  $30-60k (pre-COVID; high used supply from decommissioned fabs)
2020-2021:  $50-80k (COVID supply chain tightened used market)
2022-2023:  $80-120k (semiconductor boom; used equipment in HIGH demand)
2023-2024:  $70-100k (market cooling; more used inventory becoming available)
2025-2026:  $60-90k (estimated; balanced supply-demand for used tools)

TREND: Used ICP-RIE prices peaked in 2022-2023 during the global
semiconductor equipment shortage. Prices have begun normalizing but
remain 40-60% higher than pre-COVID levels.

DEMAND DRIVERS:
├── Compound semiconductor (GaN, SiC) growth → high demand for ICP-DRIE
├── Photonics/MEMS startups → increasing demand for 100-150 mm class tools
├── University lab expansion → consistent demand for refurbished units
└── Fab retooling → generates used supply as fabs upgrade to 300 mm+

Our Budget Recommendation

NEW PURCHASE Option (fastest delivery):

  • Trion Minilock Phantom III ICP (new): $180,000–$250,000; lead time 10–14 weeks
  • Contact: Trion Technology Inc., triontech.com
  • Fastest new-system option at reasonable cost; compact; 100 mm; load-locked

REFURBISHED Option (best value):

  • Oxford Plasmalab 100 ICP/RIE (refurb): $65,000–$85,000; lead time 4–8 weeks if in stock
  • Configuration: ICP + RIE, 100 mm, 4–6 gas lines (must include CHF₃, CF₄, O₂, Ar)
  • Condition: Fully refurbished with 6-month warranty
  • Vendor: ClassOne Equipment or Capovani Brothers (request quotes from both)

Budget: $75,000 (refurb) or $200,000 (new Trion)

Facility Requirements

Floor Space

DimensionRequirement
Footprint (tool only)1.2 m × 0.9 m (48" × 36")
With pumps + chiller1.8 m × 1.2 m (72" × 48")
Service access (rear + right)0.8 m clearance minimum
Total floor requirement2.6 m × 2.0 m (5.2 m²)
Weight450–650 kg (depending on pump config)
Floor loading300 kg/m² minimum; concrete slab preferred

Electrical

ParameterRequirement
Supply3-phase, 208 V / 60 Hz (North America) OR 380-415 V / 50 Hz (European-sourced)
Circuit breaker60 A, 3-phase dedicated panel
Wire gauge6 AWG minimum per leg
GroundRequired; isolated ground recommended for RF equipment
UPSRecommended for control PC only (1 kVA)
Inrush currentPumps draw 2–3× steady-state at startup

Power Consumption

ComponentPower DrawDuty
ICP RF generator3.0 kW max (typical 0.5–1.5 kW)Active during etch
RIE bias RF generator0.6 kW max (typical 50–200 W)Active during etch
Turbo-molecular pump0.3–0.5 kWContinuous
Roughing pump (dry scroll/rotary)0.5–1.5 kWContinuous
Chiller (recirculating)1.0–3.0 kWContinuous
Control PC + electronics0.3–0.5 kWContinuous
TOTAL SYSTEM5–9 kW typical; 12–15 kW peak

Cooling Water

ParameterRequirement
Flow rate3–5 GPM
Temperature18–22°C ± 1°C
Pressure40–60 psi
QualityDI water if closed-loop chiller; facility CW if building loop
Connection½" or ¾" quick-disconnect fittings

Gas Supply

GasPurityFlowConnectionSafety
CHF₃99.99%0–50 sccm¼" SS, VCRToxic; gas cabinet + exhaust
CF₄99.99%0–50 sccm¼" SS, VCRLow toxicity; irritant
O₂99.999%0–50 sccm¼" SS, VCROxidizer; no oil
Ar99.999%0–50 sccm¼" SS, VCRInert
N₂99.999%House supply½"Purge gas; high flow for load-lock
He99.999%0–20 sccm¼" SS, VCRBackside wafer cooling

Vibration, Sound, Lighting

ParameterSpecification
Vibration sensitivityLOW ● not vibration-sensitive during normal operation
Floor vibration limit< 50 μm/s RMS (standard lab floor acceptable)
Combined noise70–80 dB(A) at 1 m (dominated by roughing pump)
MitigationRemote pump placement; acoustic enclosure reduces 15–20 dB
Special lightingNOT REQUIRED (yellow safelight if loading resist-coated wafers)

Exhaust

ParameterSpecification
Exhaust duct4" (100 mm) diameter, stainless steel or PVC
Flow rate200–500 CFM
ScrubberMANDATORY ● dry chemical scrubber for fluorinated species + arsenic byproducts
MonitoringInline arsine detector downstream of scrubber (for As₂S₃ etch)
Code complianceLocal fire marshal sign-off for toxic gas use

Safety & Handling

Hazard Summary

HazardRisk LevelControl
CHF₃ gas leak / toxic exposureCriticalGas cabinet; toxicity monitor; auto-shutoff; training
Arsenic byproducts from As₂S₃ etchCriticalScrubber with arsine detector; dedicated exhaust; PPE
RF radiation (13.56 MHz)MediumShielded chamber; interlocks prevent operation with chamber open
High voltage (RF generators)MediumLockout/tagout during maintenance; trained personnel only
Vacuum implosionLowChamber designed to spec; annual pressure vessel inspection
Cryogenic hazard (LN₂ cooling)Low (if equipped)Gloves; ventilation; O₂ monitor in enclosed areas

PPE Requirements

  • Safety glasses when near operating tool
  • Nitrile gloves for wafer handling
  • Face shield during chamber opening / maintenance
  • Hearing protection near roughing pump (> 80 dB)
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